Abstract
An 850-nm-thick CuAlO2 film was formed by solid state reaction of evaporated thin film Cu on c-cut Al2O3 (sapphire) at 1200 °C for reaction times as short as 10 min. X-ray diffractogram confirms the formation of (0 0 l) CuAlO2, indicating oriented growth of CuAlO2 on c-cut Al2O3.
Fourier transformation infra-red (FTIR) spectra showed peaks
corresponding to Cu–O, Al–O and O–Cu–O bonds, confirming further the
CuAlO2 phase formation. UV–visible spectrum measurement
showed high transparency of the film in the visible region with a direct
band gap of 3.25 eV. The mechanism of the formation of the film is
discussed.
Keywords
- CuAlO2;
- Solid-state reaction;
- P-type;
- Transparent conducting oxides
2 comments:
I am writing to you on behalf of 10EQS (www.10EQS.com), a market research firm that conducts expert interviews in support of industry-wide studies for many of the world's Fortune 1000 companies.
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