Our Campus, USM Engineering Campus, 14300 Nibong Tebal, Penang, Malaysia
CONFERENCES
ChinaNano 2005, Beijing, June 2005
ICMAT/ICAM 2005, Singapore, July 2005
BATAN Serpong, Indonesia, Aug 2005
RCSSST 2005, Kuantan, Pahang, Malaysia, Dec 2005
Malacca, Feb 2006
AFSS2006, Johor Bahru, Malaysia, June 2006
ICXRI2006, Putrajaya, Malaysia, Nov 2006
AMEC-5, Bangkok, Thailand, Dec 2006
Nanoinsight 2007, Luxor, Egypt, March 2007
ISAF 2007, Nara, Japan, May 2007
ICMAT 2007, Singapore, July 2007
IEEE Nano 2007, Hong Kong, Aug 2007
RCSSST 2007, Johor Bahru, Malaysia, Nov 2007
ICONN 2008, Melbourne, Australia, Feb 2008
NanoSMat 2008, Barcelona, Spain, Oct 2008
RCSSST 2008, Port Dickson, malaysia, Nov 2008
Nano Conference, University of Ottawa, Canada, Aug 2010
TESTING FACILITIES
Our Scanning probe microscope (SPM)/atomic force microscope (AFM) and semiconductor parameter analyzer (SPA) are suitable to investigate:
Surface Roughness
Surface Topography
Phase Imaging
Friction Imaging
Nano-scratching
Local Current-Voltage Characterization
Nanolithography
Scanning Tunneling Microscopy
I-V and C-V Characterizations
for solid materials such as semiconductors, ceramics, metals, polymer, glass fibre, composite, biomaterials, papers, wood pulp, magnetic materials.
For more information please contact address below.
Electronic Materials Laboratory School of Materials and Mineral Resources Engineering, Universiti Sains Malaysia 14300 Nibong Tebal, Penang, Malaysia Tel. +60 4 5996171 Fax +60 4 5941011