Processing and Materials Characterization SPM/AFM and SPA

Electronic Materials Laboratory, School of Materials and Mineral Resources Engineering, Engineering Campus, Universiti Sains Malaysia

Facilities available for:

• Processing and Materials Characterization using Scanning Probe Microscopy (SPM)/Atomic Force Microscopy (AFM).
• I-V characterization of nanodevices using Semiconductor Parameter Analyzer with Nanotech Probe Station (Lakeshore Cryogenic).

SPM & AFM

Scanning Probe Microscopy comprises a family of techniques in which a sharp probe is precisely scanned across a surface. Atomic Force Microscopy is one example.

AFM can be used to solve processing and materials problems in a wide range of technologies, such as abrasion, adhesion, cleaning, corrosion, etching, friction, lithography, and polishing for materials, such as polymers, semiconductors, ceramics, glass, metals, composites, biomaterials, paper, pulp, magnetic and electronic materials.

Scanning Tunneling Microscopy (STM) is the original scanning probe technique. Because STM requires a conductive surface, its applications are somewhat limited. STM is useful in industry for examining carbon materials.

Magnetic force microscopy (MFM) shows the fine details of bit and domain structure on media, as well as the magnetic fields emanating from operating recording heads. Also shows domain structure in new magnetic materials.

Electric force microscopy distinguishes fixed charges, conductive and insulating regions and identifies short and open circuits.

Surface potential imaging (Scanning Kelvin probe) distinguishes materials based on the work function and related electronic properties. For example, the data marks in CD-RW (rewritable compact disc) are amorphous spots surrounded by crystalline regions of the quaternary alloy AgInSbTe.

Sevices

Our SPM/AFM and SPA machines are suitable for:

• Surface roughness analysis
  
• Surface topography analysis
  
• Phase imaging
• Friction imaging
• Nano-scratching
• Local Current-Voltage Characterization by conductive AFM
• Nano-oxidation and Nanolithography
  
• Scanning Tunneling Microscopy analysis
  
• I-V and C-V characterizations .
  

for solid samples such as semiconductors, ceramics, metals, polymer, glass fibre, composite, biomaterials, papers, wood pulp, magnetic materials.

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For more information please contact:

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Electronic Materials Laboratory
School of Materials and Mineral Resources Engineering,
Universiti Sains Malaysia
14300 Nibong Tebal, Penang, Malaysia
Tel. +60 4 5996171
Fax +60 4 5941011

Contact person: Dr. Sabar D. Hutagalung
E-mail: mrsabar@eng.usm.my

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